IEEE - Institute of Electrical and Electronics Engineers, Inc. - Practicality of evaluating soft errors in commercial sub-90 nm CMOS for space applications
2010 IEEE International Reliability Physics Symposium (IRPS)
| Author(s): | Pellish, J.A. ; LaBel, K.A. |
| Publisher: | IEEE - Institute of Electrical and Electronics Engineers, Inc. |
| Publication Date: | 1 May 2010 |
| Conference Location: | Garden Grove (Anaheim), CA, USA, USA |
| Conference Date: | 2 May 2010 |
| Page(s): | 768 - 774 |
| ISBN (CD): | 978-1-4244-5431-0 |
| ISBN (Electronic): | 978-1-4244-5429-7 |
| ISBN (Paper): | 978-1-4244-5430-3 |
| ISSN (CD): | 1541-7026 |
| ISSN (Electronic): | 1938-1891 |
| ISSN (Paper): | 1541-7026 |
| DOI: | 10.1109/IRPS.2010.5488737 |
Regular:
Inclusion of commercial technologies in civil spaceflight applications is reality. These technologies enable higher performance, reduce power consumption, and ultimately yield better science.... View More
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