IEEE - Institute of Electrical and Electronics Engineers, Inc. - Practicality of evaluating soft errors in commercial sub-90 nm CMOS for space applications

2010 IEEE International Reliability Physics Symposium (IRPS)

Author(s): Pellish, J.A. ; LaBel, K.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2010
Conference Location: Garden Grove (Anaheim), CA, USA, USA
Conference Date: 2 May 2010
Page(s): 768 - 774
ISBN (CD): 978-1-4244-5431-0
ISBN (Electronic): 978-1-4244-5429-7
ISBN (Paper): 978-1-4244-5430-3
ISSN (CD): 1541-7026
ISSN (Electronic): 1938-1891
ISSN (Paper): 1541-7026
DOI: 10.1109/IRPS.2010.5488737
Regular:

Inclusion of commercial technologies in civil spaceflight applications is reality. These technologies enable higher performance, reduce power consumption, and ultimately yield better science.... View More

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