IEEE - Institute of Electrical and Electronics Engineers, Inc. - Light emission from silicon solar cells as characterization technique

2010 9th International Conference on Environment and Electrical Engineering (EEEIC)

Author(s): Skarvada, P. ; Tomanek, P. ; Koktavy, P. ; Macku, R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2010
Conference Location: Prague, Czech Republic, Czech Republic
Conference Date: 16 May 2010
Page(s): 97 - 100
ISBN (CD): 978-1-4244-5371-9
ISBN (Paper): 978-1-4244-5370-2
DOI: 10.1109/EEEIC.2010.5490435
Regular:

The paper describes local photoelectric measurement results obtained with monocrystalline silicon solar cell in visible light. The measurement allows localize a weak light emission from defects at... View More

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