IEEE - Institute of Electrical and Electronics Engineers, Inc. - Compact instrumentation for radiation tolerance test of flash memories in space environment

2010 IEEE Instrumentation & Measurement Technology Conference - I2MTC 2010

Author(s): Pace, C. ; Libertino, S. ; Crupi, I. ; Marino, A. ; Lombardo, S. ; Sala, E.D. ; Capuano, G. ; Lisiansky, M. ; Roizin, Y.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2010
Conference Location: Austin, TX, USA, USA
Conference Date: 3 May 2010
Page(s): 652 - 655
ISBN (CD): 978-1-4244-2833-5
ISBN (Paper): 978-1-4244-2832-8
ISSN (CD): 1091-5281
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2010.5488118
Regular:

Aim of this work is the description of a test equipment, designed to be integrated on board of a microsatellite, able to investigate the radiation tolerance of non-volatile memory arrays in a real... View More

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