IEEE - Institute of Electrical and Electronics Engineers, Inc. - TFT-LCD for avionics applications: development, characterization and reliability analysis

2010 IEEE Instrumentation & Measurement Technology Conference - I2MTC 2010

Author(s): Catelani, M. ; Ciani, L. ; Signorini, L. ; Barile, G.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2010
Conference Location: Austin, TX, USA, USA
Conference Date: 3 May 2010
Page(s): 647 - 651
ISBN (CD): 978-1-4244-2833-5
ISBN (Paper): 978-1-4244-2832-8
ISSN (CD): 1091-5281
ISSN (Paper): 1091-5281
DOI: 10.1109/IMTC.2010.5488035
Regular:

The paper presents some experimental results concerning the development of a custom TFT-LCD for avionics applications. In particular, a detailed preliminary reliability analysis has been... View More

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