IEEE - Institute of Electrical and Electronics Engineers, Inc. - Classification of Settlements in Satellite Images Using Holistic Feature Extraction

2010 UkSim 12th International Conference on Computer Modelling and Simulation (UKSim)

Author(s): Najab, A. ; Khan, I. ; Arshad, M. ; Ahmad, F.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2010
Conference Location: Cambridge, United Kingdom, United Kingdom
Conference Date: 24 March 2010
Page(s): 267 - 271
ISBN (CD): 978-0-7695-4016-0
ISBN (Electronic): 978-1-4244-6615-3
ISBN (Paper): 978-1-4244-6614-6
DOI: 10.1109/UKSIM.2010.57
Regular:

This paper presents a holistic feature extraction technique for the classification of settlements in high resolution satellite images. The goal is to design a system which automatically classifies... View More

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