IEEE - Institute of Electrical and Electronics Engineers, Inc. - Reliable bounds for the propagation delay in VLSI nano interconnects based on Multi Wall Carbon Nano Tubes

2010 IEEE 14th Workshop on Signal Propagation on Interconnects (SPI)

Author(s): De Vivo, B. ; Lamberti, P. ; Spinelli, G. ; Tucci, V.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2010
Conference Location: Hildesheim, Germany, Germany
Conference Date: 9 May 2010
Page(s): 149 - 152
ISBN (CD): 978-1-4244-7609-1
ISBN (Electronic): 978-1-4244-7610-7
ISBN (Paper): 978-1-4244-7611-4
DOI: 10.1109/SPI.2010.5483545
Regular:

The upper and lower bounds of the time-delay due to the variations of some physical and geometrical characteristics of a nano-interconnect based on Multi Wall CNTs, suitable for the 32 and 22nm... View More

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