IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design for testability using behavioral models

Author(s): G.R. Spalding, Jr. ; P.M. VanPeteghem
Sponsor(s): IEEE Instrumentation and Measurement Society
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 December 1990
Volume: 39
Page Count: 5
Page(s): 881 - 885
ISSN (Paper): 0018-9456
ISSN (Online): 1557-9662
DOI: 10.1109/19.65789
Regular:

A systematic approach to analog design-for-testability is presented. This approach uses behavioral models for fault simulation so that objective comparisons can be made between alternative... View More

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