IEEE - Institute of Electrical and Electronics Engineers, Inc. - System engineering artifacts for SoS

2010 4th Annual IEEE Systems Conference

Author(s): Dahmann, J. ; Rebovich, G. ; Lane, J.A. ; Lowry, R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: San Diego, CA, USA, USA
Conference Date: 5 April 2010
Page(s): 13 - 17
ISBN (CD): 978-1-4244-5883-7
ISBN (Electronic): 978-1-4244-5884-4
ISBN (Paper): 978-1-4244-5882-0
DOI: 10.1109/SYSTEMS.2010.5482491
Regular:

This paper describes system of systems (SoS) systems engineering (SE) artifacts, compares and contrasts them with similar ones developed and used for individual systems, and explains how they are... View More

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