IEEE - Institute of Electrical and Electronics Engineers, Inc. - A method for analyzing system state-space coverage within a t-wise testing framework

2010 4th Annual IEEE Systems Conference

Author(s): Maximoff, J.R. ; Trela, M.D. ; Kuhn, D.R. ; Kacker, R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: San Diego, CA, USA, USA
Conference Date: 5 April 2010
Page(s): 598 - 603
ISBN (CD): 978-1-4244-5883-7
ISBN (Electronic): 978-1-4244-5884-4
ISBN (Paper): 978-1-4244-5882-0
DOI: 10.1109/SYSTEMS.2010.5482481
Regular:

Inadequate state-space coverage of complex configurable systems during test phases is an area of concern for systems engineers. Determining the state-space coverage of a proposed or executed test... View More

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