IEEE - Institute of Electrical and Electronics Engineers, Inc. - A methodological comparison of Monte Carlo Simulation and Epoch-Era Analysis for tradespace exploration in an uncertain environment

2010 4th Annual IEEE Systems Conference

Author(s): Rader, A.A. ; Ross, A.M. ; Rhodes, D.H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: San Diego, CA, USA, USA
Conference Date: 5 April 2010
Page(s): 409 - 414
ISBN (CD): 978-1-4244-5883-7
ISBN (Electronic): 978-1-4244-5884-4
ISBN (Paper): 978-1-4244-5882-0
DOI: 10.1109/SYSTEMS.2010.5482433
Regular:

This paper examines uncertainty in design and traditional methods of accounting for it, while developing a methodological comparison of Monte Carlo Simulation (MCS) and Epoch-Era Analysis (EEA).... View More

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