IEEE - Institute of Electrical and Electronics Engineers, Inc. - Research on Ontology-Based Method for Modeling Structural Damage Identification System

2010 2nd International Workshop on Intelligent Systems and Applications (ISA)

Author(s): Sun Hong-bing ; Yuan Shen-fang ; Chang Qi ; Zhang Xiaoyue ; Liang Dong
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2010
Conference Location: Wuhan, China, China
Conference Date: 22 May 2010
Page(s): 1 - 4
ISBN (Electronic): 978-1-4244-5874-5
ISBN (Paper): 978-1-4244-5872-1
DOI: 10.1109/IWISA.2010.5473370
Regular:

In an open environment, there are a large number of agents based on different semantics which caused inconvenience in collaboration each other as well as difficulties in multi-agent system... View More

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