IEEE - Institute of Electrical and Electronics Engineers, Inc. - A metric space based software clone detection approach

2010 2nd IEEE International Conference on Information Management and Engineering (ICIME)

Author(s): Li, Z.O. ; Jianling Sun
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Chengdu, China, China
Conference Date: 16 April 2010
Page(s): 393 - 397
ISBN (CD): 978-1-4244-5265-1
ISBN (Paper): 978-1-4244-5263-7
DOI: 10.1109/ICIME.2010.5478099
Regular:

Metric space is a set with definition of distance between eiements within this set. This paper introduces metric space into code cione detection, and uses the distance within a metric space to... View More

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