IEEE - Institute of Electrical and Electronics Engineers, Inc. - Investigation on damage self-diagnosis of fiber smart structures based on LS-SVM

2010 2nd IEEE International Conference on Information Management and Engineering (ICIME)

Author(s): Dong Xiaoma ; Wei Baoli ; Sun Qingzhen ; Hou Xiaoying
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Chengdu, China, China
Conference Date: 16 April 2010
Page(s): 626 - 638
ISBN (CD): 978-1-4244-5265-1
ISBN (Paper): 978-1-4244-5263-7
DOI: 10.1109/ICIME.2010.5477898
Regular:

The self-diagnosis function is one of main research contents of smart structures. And it is the foundation of other functions realization of smart structures. Aiming at the localization of present... View More

Advertisement