IEEE - Institute of Electrical and Electronics Engineers, Inc. - Method of fault diagnosis for cold storage system based on probabilistic rough set and SVM

2010 2nd IEEE International Conference on Information Management and Engineering (ICIME)

Author(s): Liu Ya-li ; Yu Feng-hao ; Chen Sheng-dong ; Mao Ming
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Chengdu, China, China
Conference Date: 16 April 2010
Page(s): 20 - 23
ISBN (CD): 978-1-4244-5265-1
ISBN (Paper): 978-1-4244-5263-7
DOI: 10.1109/ICIME.2010.5477747
Regular:

Proposed a method of fault diagnosis for cold storage system, the method based on probabilistic rough set and support vector machine(SVM). Simplify the uncertain information by using probabilistic... View More

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