IEEE - Institute of Electrical and Electronics Engineers, Inc. - A high quality factor varactor technology evaluation

2010 IEEE Radio Frequency Integrated Circuits Symposium (RFIC 2010)

Author(s): Romain Debroucke ; Sebastien Jan ; Jean-François Larchanché ; Christophe Gaquière
Sponsor(s): IEEE Microwave Theory Tech. Soc.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2010
Conference Location: Anaheim, CA, USA
Conference Date: 23 May 2010
Page(s): 585 - 588
ISBN (CD): 978-1-4244-6242-1
ISBN (Electronic): 978-1-4244-6243-8
ISBN (Paper): 978-1-4244-6240-7
ISSN (CD): 1529-2517
ISSN (Electronic): 2375-0995
ISSN (Paper): 1529-2517
DOI: 10.1109/RFIC.2010.5477308
Regular:

Providing a high quality factor scalable varactor in an integrated technology is a wager. How to insure that your device will give the highest quality factor possible? In order to response this... View More

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