IEEE - Institute of Electrical and Electronics Engineers, Inc. - Design of high speed burst-mode BERT based on FPGA

2010 2nd International Conference on Networking and Digital Society (ICNDS)

Author(s): Leijun Sun ; Wei Chen ; Qiuyuan Huang ; Chao Ma
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 May 2010
Conference Location: Wenzhou, China, China
Conference Date: 30 May 2010
Volume: 1
Page(s): 85 - 88
ISBN (Paper): 978-1-4244-5162-3
DOI: 10.1109/ICNDS.2010.5479306
Regular:

Being different from general continual-data stream BER tester, the receiver of burst-mode BER tester is required to extract clock and recover data accurately from the incoming datasteam... View More

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