IEEE - Institute of Electrical and Electronics Engineers, Inc. - Sampling optimization for macro-modeling interconnect parasitic extraction

MELECON 2010 - 2010 15th IEEE Mediterranean Electrotechnical Conference

Author(s): Shehata Abdellatif, A. ; El Rouby, A.B. ; Abdelhalim, M.B. ; Khalil, A.H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Valletta, Malta, Malta
Conference Date: 26 April 2010
Page(s): 1,482 - 1,487
ISBN (CD): 978-1-4244-5794-6
ISBN (Electronic): 978-1-4244-5795-3
ISBN (Paper): 978-1-4244-5793-9
DOI: 10.1109/MELCON.2010.5476241
Regular:

Parasitic extraction is a critical task for modern nano scale semiconductor circuits which are characterized by high speed, small feature size and dense layout. Among the available extraction... View More

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