IEEE - Institute of Electrical and Electronics Engineers, Inc. - Using SAT techniques in dynamic burn-in vector generation

MELECON 2010 - 2010 15th IEEE Mediterranean Electrotechnical Conference

Author(s): Aloul, F.A. ; Sagahyroon, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Valletta, Malta, Malta
Conference Date: 26 April 2010
Page(s): 1,448 - 1,452
ISBN (CD): 978-1-4244-5794-6
ISBN (Electronic): 978-1-4244-5795-3
ISBN (Paper): 978-1-4244-5793-9
DOI: 10.1109/MELCON.2010.5476223
Regular:

Dynamic burn-in testing is an integral component of any test plan that seeks to produce reliable integrated circuits. Despite its importance in ensuring the reliability of semiconductors, burn-in... View More

Advertisement