IEEE - Institute of Electrical and Electronics Engineers, Inc. - Average power reduction in compression-based scan designs

MELECON 2010 - 2010 15th IEEE Mediterranean Electrotechnical Conference

Author(s): AlQuraishi, E. ; AlTeenan, R.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Valletta, Malta, Malta
Conference Date: 26 April 2010
Page(s): 504 - 509
ISBN (CD): 978-1-4244-5794-6
ISBN (Electronic): 978-1-4244-5795-3
ISBN (Paper): 978-1-4244-5793-9
DOI: 10.1109/MELCON.2010.5476222
Regular:

Toggling of scan cells during the shift of consecutive complementary values reflects into excessive switching activity in the combinational logic under test unnecessarily. Elevated levels of power... View More

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