IEEE - Institute of Electrical and Electronics Engineers, Inc. - A new look at classification of transformer normal and abnormal currents

MELECON 2010 - 2010 15th IEEE Mediterranean Electrotechnical Conference

Author(s): Abdel-Hafez, M. ; Gaouda, A.M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Valletta, Malta, Malta
Conference Date: 26 April 2010
Page(s): 830 - 834
ISBN (CD): 978-1-4244-5794-6
ISBN (Electronic): 978-1-4244-5795-3
ISBN (Paper): 978-1-4244-5793-9
DOI: 10.1109/MELCON.2010.5475955
Regular:

The paper proposes an enhanced wavelet-based feature extraction technique to classify transformer inrush currents (TIC) and transformer internal faults (TIF). The proposed tool utilizes the number... View More

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