IEEE - Institute of Electrical and Electronics Engineers, Inc. - Scattering of 3-D objects with a new total-and scattered-field decomposition technique for FEM

2010 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)

Author(s): Zengwei Liu ; Lanlan Ping ; Ben Sun ; Guangfa Sun ; Xiaoxiang He
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Beijing, China, China
Conference Date: 12 April 2010
Page(s): 1,462 - 1,465
ISBN (CD): 978-1-4244-5622-2
ISBN (Electronic): 978-1-4244-5623-9
ISBN (Paper): 978-1-4244-5621-5
DOI: 10.1109/APEMC.2010.5475836
Regular:

Finite element method (FEM) is combined with volumetric plane-wave excitation method (VPWE) and total-and scattered-field decomposition(TSFD)technique is used to analyze some... View More

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