IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of platform noise effect on WWAN performance

2010 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)

Author(s): Han-Nien Lin ; Ching-Hsien Lin ; Ming-Cheng Chang ; Yu-Yang Shih
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Beijing, China, China
Conference Date: 12 April 2010
Page(s): 719 - 722
ISBN (CD): 978-1-4244-5622-2
ISBN (Electronic): 978-1-4244-5623-9
ISBN (Paper): 978-1-4244-5621-5
DOI: 10.1109/APEMC.2010.5475800
Regular:

With the advance of semiconductor and wireless communications technologies in recent years, the systems of highly integrated high-speed digital circuits and multi-radio modules have paved the way... View More

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