IEEE - Institute of Electrical and Electronics Engineers, Inc. - Radiated EMI prediction and mechanism modeling from measured noise of microcontroller

2010 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)

Author(s): Han-Nien Lin ; Tai-jung Cheng ; Chih-Min Liao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Beijing, China, China
Conference Date: 12 April 2010
Page(s): 727 - 731
ISBN (CD): 978-1-4244-5622-2
ISBN (Electronic): 978-1-4244-5623-9
ISBN (Paper): 978-1-4244-5621-5
DOI: 10.1109/APEMC.2010.5475791
Regular:

Since many extremely susceptible components with low-voltage operation or high sensitivity may be affected from EMI noise and degrade their performance, the EMI phenomena from IC becomes an issue... View More

Advertisement