IEEE - Institute of Electrical and Electronics Engineers, Inc. - In-situ EMC testing using surface current sense wires

2010 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)

Author(s): Coenen, M. ; Maas, T. ; Yili Hu ; van Roermund, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Beijing, China, China
Conference Date: 12 April 2010
Page(s): 586 - 589
ISBN (CD): 978-1-4244-5622-2
ISBN (Electronic): 978-1-4244-5623-9
ISBN (Paper): 978-1-4244-5621-5
DOI: 10.1109/APEMC.2010.5475752
Regular:

In-situ EMC testing is, for large fixed systems and installations within the scope of the European EMC Directive, not a primary requirement other than unintended RF emissions may not affect... View More

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