IEEE - Institute of Electrical and Electronics Engineers, Inc. - Observation of ground potential rise caused by artificially-triggered lightning

2010 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)

Author(s): Jing Yang ; Jian-Guo Wang ; Yang Zhao ; Qi-Lin Zhang ; Tie Yuan ; Yun-Jun Zhou ; Gui-Li Feng
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Beijing, China, China
Conference Date: 12 April 2010
Page(s): 1,297 - 1,300
ISBN (CD): 978-1-4244-5622-2
ISBN (Electronic): 978-1-4244-5623-9
ISBN (Paper): 978-1-4244-5621-5
DOI: 10.1109/APEMC.2010.5475745
Regular:

Comparative analysis was made between the ground potential rise resulted from an artificially-triggered flash, the channel base current and close magnetic fields. The results indicated that... View More

Advertisement