IEEE - Institute of Electrical and Electronics Engineers, Inc. - Passive-intermodulation analysis between rough circular waveguide flanges using Weibull distribution

2010 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)

Author(s): Wang, X.B. ; Zhang, N. ; Hu, T.C. ; Sun, Q.F. ; Cui, W.Z. ; Ye, M. ; He, Y.N.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Beijing, China, China
Conference Date: 12 April 2010
Page(s): 1,442 - 1,445
ISBN (CD): 978-1-4244-5622-2
ISBN (Electronic): 978-1-4244-5623-9
ISBN (Paper): 978-1-4244-5621-5
DOI: 10.1109/APEMC.2010.5475733
Regular:

In this paper, the Weibull distribution is employed to characterise the surface topography in the analysis of the passive intermodulation(PIM) between rough circular waveguide flanges,... View More

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