IEEE - Institute of Electrical and Electronics Engineers, Inc. - Alteration of BBB tight junction protein expression induced by EMP exposure

2010 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)

Author(s): Gui-Rong Ding ; Lian-Bo Qiu ; Kang-Chu Li ; Xiao-Wu Wang ; Yong-Chun Zhou ; Yan Zhou ; Jun-ye Liu ; Yu-Rong Li ; Guo-Zhen Guo
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Beijing, China, China
Conference Date: 12 April 2010
Page(s): 374 - 376
ISBN (CD): 978-1-4244-5622-2
ISBN (Electronic): 978-1-4244-5623-9
ISBN (Paper): 978-1-4244-5621-5
DOI: 10.1109/APEMC.2010.5475732
Regular:

In this study, we examined the effects of exposure to electromagnetic pulse(EMP) on the functional integrity of the BBB and, on the expression of tight junction (TJ) protein (occludin, ZO-1) in... View More

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