IEEE - Institute of Electrical and Electronics Engineers, Inc. - Considerations of EMI and EMC in the design of 3D imaging microwave altimeter

2010 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)

Author(s): Lan Ailan ; Zhang Xiangkun ; Zhang Yunhua ; Yin Honggang ; Jiang Jingshan
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Beijing, China, China
Conference Date: 12 April 2010
Page(s): 641 - 644
ISBN (CD): 978-1-4244-5622-2
ISBN (Electronic): 978-1-4244-5623-9
ISBN (Paper): 978-1-4244-5621-5
DOI: 10.1109/APEMC.2010.5475731
Regular:

The 3D imaging microwave altimeter is a proposed instrument for obtaining centimeter level accuracy of topography for ocean and meter-level accuracy of topography for land. In order to ensure the... View More

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