IEEE - Institute of Electrical and Electronics Engineers, Inc. - Relationship between the shape of electric field probes and their measuring performances

2010 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)

Author(s): Zhang Xiaoming ; Meng Cui ; Liu Yinong
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Beijing, China, China
Conference Date: 12 April 2010
Page(s): 405 - 408
ISBN (CD): 978-1-4244-5622-2
ISBN (Electronic): 978-1-4244-5623-9
ISBN (Paper): 978-1-4244-5621-5
DOI: 10.1109/APEMC.2010.5475730
Regular:

Measurement of electric field, especially pulsed electric field, plays an important role in EMC designing, EMP study and many other fields. These years, researchers all over the world have done... View More

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