IEEE - Institute of Electrical and Electronics Engineers, Inc. - Conversion of radiated field strength at different distance in semi-anechoic chamber

2010 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)

Author(s): Luo-quan Hu
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Beijing, China, China
Conference Date: 12 April 2010
Page(s): 1,598 - 1,601
ISBN (CD): 978-1-4244-5622-2
ISBN (Electronic): 978-1-4244-5623-9
ISBN (Paper): 978-1-4244-5621-5
DOI: 10.1109/APEMC.2010.5475729
Regular:

The conversion of radiated field strength at different distance in semi-anechoic chamber is analyzed. Firstly, the empirical model based on the logarithmic distance path loss is introduced.... View More

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