IEEE - Institute of Electrical and Electronics Engineers, Inc. - Zooming into the near field: A novel formulation of the BEM as applied to EMC modelling and simulation problems

2010 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)

Author(s): Baghai-Wadji, A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Beijing, China, China
Conference Date: 12 April 2010
Page(s): 177 - 182
ISBN (CD): 978-1-4244-5622-2
ISBN (Electronic): 978-1-4244-5623-9
ISBN (Paper): 978-1-4244-5621-5
DOI: 10.1109/APEMC.2010.5475700
Regular:

The Boundary Element Method is a versatile and powerful numerical technique which has been successfully applied to EMC problems in device modelling at various scales and frequency ranges. The... View More

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