IEEE - Institute of Electrical and Electronics Engineers, Inc. - Analysis of transient electromagnetic scattering from arbitrary objects

2010 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)

Author(s): Ohnuki, S. ; Kitaoka, Y. ; Kishimoto, S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Beijing, China, China
Conference Date: 12 April 2010
Page(s): 877 - 880
ISBN (CD): 978-1-4244-5622-2
ISBN (Electronic): 978-1-4244-5623-9
ISBN (Paper): 978-1-4244-5621-5
DOI: 10.1109/APEMC.2010.5475663
Regular:

A novel computational technique is proposed for transient electromagnetic scattering problems. Our technique is based on the combination of the method of moments and the fast inversion of the... View More

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