IEEE - Institute of Electrical and Electronics Engineers, Inc. - A new portable test system for surge protective device (SPD)

2010 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)

Author(s): Long Chao ; Zhou Wen-jun ; Wang Lei ; Lao Si-jia ; Yu Jian-hui ; Qiu Ling ; Yi Xiao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Beijing, China, China
Conference Date: 12 April 2010
Page(s): 1,554 - 1,557
ISBN (CD): 978-1-4244-5622-2
ISBN (Electronic): 978-1-4244-5623-9
ISBN (Paper): 978-1-4244-5621-5
DOI: 10.1109/APEMC.2010.5475660
Regular:

In order to solve the problem of field testing the surge protective device (SPD) of the electrical and electronic equipments in low-voltage (LV) power system, this paper proposed a portable field... View More

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