IEEE - Institute of Electrical and Electronics Engineers, Inc. - An improved dual-probe approach to measure noise source impedance

2010 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)

Author(s): Zhao Bo ; Zhao Min ; Feng Zhiming ; Shui Limin ; Yao Min
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Beijing, China, China
Conference Date: 12 April 2010
Page(s): 214 - 217
ISBN (CD): 978-1-4244-5622-2
ISBN (Electronic): 978-1-4244-5623-9
ISBN (Paper): 978-1-4244-5621-5
DOI: 10.1109/APEMC.2010.5475573
Regular:

In this paper an improved dual-probe approach is proposed to measure the source impedance of conducted EMI noise. Two-impedance method, which can reduce the influence of testing cable loss caused... View More

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