IEEE - Institute of Electrical and Electronics Engineers, Inc. - On the modelling of transient scattering under ultra wideband short-pulse electromagnetic excitation

2010 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)

Author(s): Hoi-Shun Lui ; Shuley, N.V.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Beijing, China, China
Conference Date: 12 April 2010
Page(s): 854 - 857
ISBN (CD): 978-1-4244-5622-2
ISBN (Electronic): 978-1-4244-5623-9
ISBN (Paper): 978-1-4244-5621-5
DOI: 10.1109/APEMC.2010.5475534
Regular:

Accurate modelling of electromagnetic radiation, scattering and propagation using ultra wideband (UWB) sources has been of significant interest with ongoing application in areas such as... View More

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