IEEE - Institute of Electrical and Electronics Engineers, Inc. - Fault detection of univariate non-Gaussian data with Bayesian network

2010 IEEE International Conference on Industrial Technology (ICIT 2010)

Author(s): Sylvain Verron ; Teodor Tiplica ; Abdessamad Kobi
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2010
Conference Location: Vina del Mar, Chile
Conference Date: 14 March 2010
Page(s): 94 - 99
ISBN (Electronic): 978-1-4244-5697-0
ISBN (Paper): 978-1-4244-5695-6
ISBN (Online): 978-1-4244-5696-3
DOI: 10.1109/ICIT.2010.5472659
Regular:

The purpose of this article is to present a new method for fault detection with Bayesian network. The interest of this method is to propose a new structure of Bayesian network allowing to detect a... View More

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