IEEE - Institute of Electrical and Electronics Engineers, Inc. - Test Generation Based on Abstraction and Test Purposes to Complement Structural Tests

2010 IEEE International Conference on Software Testing Verification and Validation Workshop (ICSTW)

Author(s): Bouquet, F. ; Bue, P.-C. ; Julliand, J. ; Masson, P.-A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 April 2010
Conference Location: Paris, France, France
Conference Date: 6 April 2010
Page(s): 54 - 61
ISBN (CD): 978-0-7695-4050-4
ISBN (Electronic): 978-1-4244-6774-7
ISBN (Paper): 978-1-4244-6773-0
DOI: 10.1109/ICSTW.2010.47
Regular:

This paper presents a computer aided model-based test generation method. We propose this approach as a complement to the LTG (Leirios Test Generator) method, which extracts functional tests out of... View More

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