IEEE - Institute of Electrical and Electronics Engineers, Inc. - A Heuristic Structure Mutation Operator Based on Sensitivity for Evolutionary Neural Network

2010 2nd International Workshop on Education Technology and Computer Science (ETCS)

Author(s): Biying Zhang
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2010
Conference Location: Wuhan, China, China
Conference Date: 6 March 2010
Volume: 3
Page(s): 44 - 47
ISBN (Electronic): 978-1-4244-6389-3
ISBN (Paper): 978-1-4244-6388-6
DOI: 10.1109/ETCS.2010.146
Regular:

Node deletion and node addition are two important types of structure mutations for evolutionary neural network (ENN). How to select mutation type and mutation node has a crucial impact on the... View More

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