IEEE - Institute of Electrical and Electronics Engineers, Inc. - Formal Verification for Quality Analysis of SDG Fault Diagnosis Model via Symbolic Model Checking

2010 International Conference on Measuring Technology and Mechatronics Automation (ICMTMA 2010)

Author(s): Ning Ning ; Zhang Jun ; Gao Xiangyang ; Xue Jing
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2010
Conference Location: Changsha City, China, China
Conference Date: 13 March 2010
Volume: 2
Page(s): 305 - 308
ISBN (Electronic): 978-1-4244-5739-7
ISBN (Paper): 978-1-4244-5001-5
DOI: 10.1109/ICMTMA.2010.103
Regular:

The verification for quality property of SDG fault diagnosis model is originally placed at the framework of symbolic model checking (SMC). SDG model is translated to the symbolic model verifier... View More

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