IEEE - Institute of Electrical and Electronics Engineers, Inc. - Integrated risk sensitivity study for Lunar Surface Systems

2010 Annual Reliability and Maintainability Symposium (RAMS)

Author(s): Go, S. ; Mathias, D.L. ; Nejad, H.S.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2010
Conference Location: San Jose, CA, USA, USA
Conference Date: 25 January 2010
Page(s): 1 - 6
ISBN (CD): 978-1-4244-5103-6
ISBN (Paper): 978-1-4244-5102-9
ISSN (CD): 0149-144X
ISSN (Paper): 0149-144X
DOI: 10.1109/RAMS.2010.5448002
Regular:

This paper illustrates an innovative approach to assessing the reliability of conceptual Lunar Surface Systems architectures using an integrated analysis model. The integrated model represents... View More

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