IEEE - Institute of Electrical and Electronics Engineers, Inc. - A conceptual model for “inherent reliability” for nuclear weapons

2010 Annual Reliability and Maintainability Symposium (RAMS)

Author(s): Bierbaum, R.L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2010
Conference Location: San Jose, CA, USA, USA
Conference Date: 25 January 2010
Page(s): 1 - 6
ISBN (CD): 978-1-4244-5103-6
ISBN (Paper): 978-1-4244-5102-9
ISSN (CD): 0149-144X
ISSN (Paper): 0149-144X
DOI: 10.1109/RAMS.2010.5447992
Regular:

Many people, when thinking about different stages of a particular device's life vis-à-vis defectiveness, use the notion of the "bathtub curve" as a model. However this model is not fully... View More

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