IEEE - Institute of Electrical and Electronics Engineers, Inc. - The application of CREAM based on HAZOP analysis in using process of system

2010 Annual Reliability and Maintainability Symposium (RAMS)

Author(s): Wei Wang ; Tingdi Zhao
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2010
Conference Location: San Jose, CA, USA, USA
Conference Date: 25 January 2010
Page(s): 1 - 6
ISBN (CD): 978-1-4244-5103-6
ISBN (Paper): 978-1-4244-5102-9
ISSN (CD): 0149-144X
ISSN (Paper): 0149-144X
DOI: 10.1109/RAMS.2010.5447991
Regular:

The foundation of the retrospective and predictive analysis in Cognitive Reliability and Error Analysis Method (CREAM) is the search of the event sequence caused by human errors. However, there... View More

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