IEEE - Institute of Electrical and Electronics Engineers, Inc. - Using risk assessment to mitigate new business demands uncertainties

2010 Annual Reliability and Maintainability Symposium (RAMS)

Author(s): Scapin, C.A. ; de Alencar Miranda Gomes, L.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2010
Conference Location: San Jose, CA, USA, USA
Conference Date: 25 January 2010
Page(s): 1 - 6
ISBN (CD): 978-1-4244-5103-6
ISBN (Paper): 978-1-4244-5102-9
ISSN (CD): 0149-144X
ISSN (Paper): 0149-144X
DOI: 10.1109/RAMS.2010.5447974
Regular:

The association of FTA, cut set probabilities, Cost Risk Simulation and QFD principles in a sequence make possible the development of a conceptual model of risk management process to support a... View More

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