IEEE - Institute of Electrical and Electronics Engineers, Inc. - Risk assessment sensitivities for very low probability events with severe consequences

2010 IEEE Aerospace Conference

Author(s): Powell, M.A.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2010
Conference Location: Big Sky, MT, USA, USA
Conference Date: 6 March 2010
Page(s): 1 - 9
ISBN (CD): 978-1-4244-3888-4
ISBN (Paper): 978-1-4244-3887-7
ISSN (CD): 1095-323X
ISSN (Paper): 1095-323X
DOI: 10.1109/AERO.2010.5446865
Regular:

Modern aerospace systems are typically designed to satisfy numerous very stringent performance requirements. The risks posed thus encompass very low probability events with severe consequences.... View More

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