IEEE - Institute of Electrical and Electronics Engineers, Inc. - Characterization and qualification of radiation hardened nonvolatile phase change memory technology

2010 IEEE Aerospace Conference

Author(s): Rodgers, J. ; Rockett, L. ; Maimon, J. ; Storey, T. ; Nixon, P.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2010
Conference Location: Big Sky, MT, USA, USA
Conference Date: 6 March 2010
Page(s): 1 - 8
ISBN (CD): 978-1-4244-3888-4
ISBN (Paper): 978-1-4244-3887-7
ISSN (CD): 1095-323X
ISSN (Paper): 1095-323X
DOI: 10.1109/AERO.2010.5446662
Regular:

BAE Systems has developed a 4Mb Non-Volatile Chalcogenide Random Access Memory (C-RAM) optimized for the radiation environments encountered in spacecraft applications. C-RAM is a phase change... View More

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