IEEE - Institute of Electrical and Electronics Engineers, Inc. - Investigation of dust in electrohydrodynamic (EHD) systems

2010 IEEE/CPMT 26th Semiconductor Thermal Measurement, Modeling & Management Symposium (SEMI-THERM)

Author(s): N E Jewell-Larsen ; S V Karpov ; H Ran ; P Savalia ; K A Honer
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2010
Conference Location: Santa Clara, CA, USA
Conference Date: 21 February 2010
Page(s): 249 - 255
ISBN (CD): 978-1-4244-9459-0
ISBN (Electronic): 978-1-4244-9460-6
ISBN (Paper): 978-1-4244-9458-3
ISBN (Online): 978-1-4244-9461-3
ISSN (CD): 1065-2221
ISSN (Paper): 1065-2221
DOI: 10.1109/STHERM.2010.5444283
Regular:

Convection remains the most popular cooling solution for portable consumer electronic devices. However, increasing heat generation in microelectronics and the demand for increasingly compact... View More

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