IEEE - Institute of Electrical and Electronics Engineers, Inc. - Enhancing random access scan for soft error tolerance

2010 42nd Southeastern Symposium on System Theory (SSST 2010)

Author(s): Fan Wang ; Agrawal, V.D.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 March 2010
Conference Location: Tyler, TX, USA, USA
Conference Date: 7 March 2010
Page(s): 263 - 268
ISBN (CD): 978-1-4244-5692-5
ISBN (Electronic): 978-1-4244-5691-8
ISBN (Paper): 978-1-4244-5690-1
ISSN (CD): 0094-2898
ISSN (Paper): 0094-2898
DOI: 10.1109/SSST.2010.5442827
Regular:

Recent work on random access scan (RAS) has shown its advantages in reducing test application time, test data volume and test power over those of the conventional serial scan (SS). This paper is... View More

Advertisement