IEEE - Institute of Electrical and Electronics Engineers, Inc. - Measuring the Level of Security Introduced by Security Patterns

2010 International Conference on Availability, Reliability, and Security (ARES)

Author(s): Fernandez, E.B. ; Yoshioka, N. ; Washizaki, H. ; VanHilst, M.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2010
Conference Location: Krakow, Poland, Poland
Conference Date: 15 February 2010
Page(s): 565 - 568
ISBN (CD): 978-0-7695-3965-2
ISBN (Electronic): 978-1-4244-5880-6
ISBN (Paper): 978-1-4244-5879-0
DOI: 10.1109/ARES.2010.111
Regular:

It is possible to reasonably measure the security quality of individual security patterns. However, more interesting is to ask: Can we show that a system built using security patterns is secure in... View More

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