IEEE - Institute of Electrical and Electronics Engineers, Inc. - Assessment of the Trade-off Curve Accuracy in the Bump Hunting Using the Tree-GA

2010 3rd International Conference on Knowledge Discovery and Data Mining (WKDD)

Author(s): Hirose, H.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 January 2010
Conference Location: Phuket, Thailand, Thailand
Conference Date: 9 January 2010
Page(s): 597 - 600
ISBN (Electronic): 978-1-4244-5398-6
ISBN (Paper): 978-1-4244-5397-9
DOI: 10.1109/WKDD.2010.154
Regular:

Suppose that we are interested in classifying n points in a z-dimensional space into two groups having response 1 and response 0 as the target variable. In some real data cases in customer... View More

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