IEEE - Institute of Electrical and Electronics Engineers, Inc. - Ontology-Driven Relation Extraction by Pattern Discovery

2010 Second International Conference on Information, Process, and Knowledge Management (eKNOW)

Author(s): Bellandi, A. ; Nasoni, S. ; Tommasi, A. ; Zavattari, C.
Publisher: IEEE - Institute of Electrical and Electronics Engineers, Inc.
Publication Date: 1 February 2010
Conference Location: Saint Maarten, Netherland Antilles, Netherland Antilles
Conference Date: 10 February 2010
Page(s): 1 - 6
ISBN (CD): 978-0-7695-3956-0
ISBN (Electronic): 978-1-4244-5689-5
ISBN (Paper): 978-1-4244-5688-8
DOI: 10.1109/eKNOW.2010.17
Regular:

With this paper we describe an ontology-driven system that performs relation extraction over textual data. The system exploits expert knowledge of the domain, including lexical resources, in the... View More

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